Extraction of diffusion length using junction-less EBIC

• Main Authors: Ong, Vincent K. S., Tan, Chee Chin., Radhakrishnan, K.
• Other Authors: School of Electrical and Electronic Engineering
• Format: Conference or Workshop Item
• Language: English
• Published: 2010
• Subjects: DRNTU::Engineering::Electrical and electronic engineering::Electronic systems::Signal processing
• Online Access: https://hdl.handle.net/10356/92076; http://hdl.handle.net/10220/6339; http://ieeexplore.ieee.org/search/freesrchabstract.jsp?tp=&arnumber=5403693&queryText%3DExtraction+of+Diffusion+Length+Using+Junction-less+EBIC%26openedRefinements%3D*%26searchField%3DSearch+All; http://www.isic2009.org/
• Institution: Nanyang Technological University

The electron-beam-induced current (EBIC) mode...