Extraction of diffusion length using junction-less EBIC
The electron-beam-induced current (EBIC) mode...
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Main Authors: | Ong, Vincent K. S., Tan, Chee Chin., Radhakrishnan, K. |
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其他作者: | School of Electrical and Electronic Engineering |
格式: | Conference or Workshop Item |
語言: | English |
出版: |
2010
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主題: | |
在線閱讀: | https://hdl.handle.net/10356/92076 http://hdl.handle.net/10220/6339 http://ieeexplore.ieee.org/search/freesrchabstract.jsp?tp=&arnumber=5403693&queryText%3DExtraction+of+Diffusion+Length+Using+Junction-less+EBIC%26openedRefinements%3D*%26searchField%3DSearch+All http://www.isic2009.org/ |
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