Elemental thin film depth profiles by ion beam analysis using simulated annealing - A new tool
10.1088/0022-3727/36/7/201
Saved in:
Main Authors: | , , , , , , |
---|---|
Other Authors: | |
Format: | Review |
Published: |
2014
|
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/105496 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
id |
sg-nus-scholar.10635-105496 |
---|---|
record_format |
dspace |
spelling |
sg-nus-scholar.10635-1054962023-10-27T09:35:28Z Elemental thin film depth profiles by ion beam analysis using simulated annealing - A new tool Jeynes, C. Barradas, N.P. Marriott, P.K. Boudreault, G. Jenkin, M. Wendler, E. Webb, R.P. STATISTICS & APPLIED PROBABILITY 10.1088/0022-3727/36/7/201 Journal of Physics D: Applied Physics 36 7 R97-R126 JPAPB 2014-10-28T05:16:58Z 2014-10-28T05:16:58Z 2003-04-07 Review Jeynes, C., Barradas, N.P., Marriott, P.K., Boudreault, G., Jenkin, M., Wendler, E., Webb, R.P. (2003-04-07). Elemental thin film depth profiles by ion beam analysis using simulated annealing - A new tool. Journal of Physics D: Applied Physics 36 (7) : R97-R126. ScholarBank@NUS Repository. https://doi.org/10.1088/0022-3727/36/7/201 00223727 http://scholarbank.nus.edu.sg/handle/10635/105496 000182586400001 Scopus |
institution |
National University of Singapore |
building |
NUS Library |
continent |
Asia |
country |
Singapore Singapore |
content_provider |
NUS Library |
collection |
ScholarBank@NUS |
description |
10.1088/0022-3727/36/7/201 |
author2 |
STATISTICS & APPLIED PROBABILITY |
author_facet |
STATISTICS & APPLIED PROBABILITY Jeynes, C. Barradas, N.P. Marriott, P.K. Boudreault, G. Jenkin, M. Wendler, E. Webb, R.P. |
format |
Review |
author |
Jeynes, C. Barradas, N.P. Marriott, P.K. Boudreault, G. Jenkin, M. Wendler, E. Webb, R.P. |
spellingShingle |
Jeynes, C. Barradas, N.P. Marriott, P.K. Boudreault, G. Jenkin, M. Wendler, E. Webb, R.P. Elemental thin film depth profiles by ion beam analysis using simulated annealing - A new tool |
author_sort |
Jeynes, C. |
title |
Elemental thin film depth profiles by ion beam analysis using simulated annealing - A new tool |
title_short |
Elemental thin film depth profiles by ion beam analysis using simulated annealing - A new tool |
title_full |
Elemental thin film depth profiles by ion beam analysis using simulated annealing - A new tool |
title_fullStr |
Elemental thin film depth profiles by ion beam analysis using simulated annealing - A new tool |
title_full_unstemmed |
Elemental thin film depth profiles by ion beam analysis using simulated annealing - A new tool |
title_sort |
elemental thin film depth profiles by ion beam analysis using simulated annealing - a new tool |
publishDate |
2014 |
url |
http://scholarbank.nus.edu.sg/handle/10635/105496 |
_version_ |
1781788060723183616 |