Elemental thin film depth profiles by ion beam analysis using simulated annealing - A new tool
10.1088/0022-3727/36/7/201
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2014
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| Online Access: | http://scholarbank.nus.edu.sg/handle/10635/105496 |
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sg-nus-scholar.10635-1054962023-10-27T09:35:28Z Elemental thin film depth profiles by ion beam analysis using simulated annealing - A new tool Jeynes, C. Barradas, N.P. Marriott, P.K. Boudreault, G. Jenkin, M. Wendler, E. Webb, R.P. STATISTICS & APPLIED PROBABILITY 10.1088/0022-3727/36/7/201 Journal of Physics D: Applied Physics 36 7 R97-R126 JPAPB 2014-10-28T05:16:58Z 2014-10-28T05:16:58Z 2003-04-07 Review Jeynes, C., Barradas, N.P., Marriott, P.K., Boudreault, G., Jenkin, M., Wendler, E., Webb, R.P. (2003-04-07). Elemental thin film depth profiles by ion beam analysis using simulated annealing - A new tool. Journal of Physics D: Applied Physics 36 (7) : R97-R126. ScholarBank@NUS Repository. https://doi.org/10.1088/0022-3727/36/7/201 00223727 http://scholarbank.nus.edu.sg/handle/10635/105496 000182586400001 Scopus |
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National University of Singapore |
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Asia |
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Singapore Singapore |
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| description |
10.1088/0022-3727/36/7/201 |
| author2 |
STATISTICS & APPLIED PROBABILITY |
| author_facet |
STATISTICS & APPLIED PROBABILITY Jeynes, C. Barradas, N.P. Marriott, P.K. Boudreault, G. Jenkin, M. Wendler, E. Webb, R.P. |
| format |
Review |
| author |
Jeynes, C. Barradas, N.P. Marriott, P.K. Boudreault, G. Jenkin, M. Wendler, E. Webb, R.P. |
| spellingShingle |
Jeynes, C. Barradas, N.P. Marriott, P.K. Boudreault, G. Jenkin, M. Wendler, E. Webb, R.P. Elemental thin film depth profiles by ion beam analysis using simulated annealing - A new tool |
| author_sort |
Jeynes, C. |
| title |
Elemental thin film depth profiles by ion beam analysis using simulated annealing - A new tool |
| title_short |
Elemental thin film depth profiles by ion beam analysis using simulated annealing - A new tool |
| title_full |
Elemental thin film depth profiles by ion beam analysis using simulated annealing - A new tool |
| title_fullStr |
Elemental thin film depth profiles by ion beam analysis using simulated annealing - A new tool |
| title_full_unstemmed |
Elemental thin film depth profiles by ion beam analysis using simulated annealing - A new tool |
| title_sort |
elemental thin film depth profiles by ion beam analysis using simulated annealing - a new tool |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/105496 |
| _version_ |
1781788060723183616 |