Elemental thin film depth profiles by ion beam analysis using simulated annealing - A new tool

10.1088/0022-3727/36/7/201

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Bibliographic Details
Main Authors: Jeynes, C., Barradas, N.P., Marriott, P.K., Boudreault, G., Jenkin, M., Wendler, E., Webb, R.P.
Other Authors: STATISTICS & APPLIED PROBABILITY
Format: Review
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/105496
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-1054962023-10-27T09:35:28Z Elemental thin film depth profiles by ion beam analysis using simulated annealing - A new tool Jeynes, C. Barradas, N.P. Marriott, P.K. Boudreault, G. Jenkin, M. Wendler, E. Webb, R.P. STATISTICS & APPLIED PROBABILITY 10.1088/0022-3727/36/7/201 Journal of Physics D: Applied Physics 36 7 R97-R126 JPAPB 2014-10-28T05:16:58Z 2014-10-28T05:16:58Z 2003-04-07 Review Jeynes, C., Barradas, N.P., Marriott, P.K., Boudreault, G., Jenkin, M., Wendler, E., Webb, R.P. (2003-04-07). Elemental thin film depth profiles by ion beam analysis using simulated annealing - A new tool. Journal of Physics D: Applied Physics 36 (7) : R97-R126. ScholarBank@NUS Repository. https://doi.org/10.1088/0022-3727/36/7/201 00223727 http://scholarbank.nus.edu.sg/handle/10635/105496 000182586400001 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1088/0022-3727/36/7/201
author2 STATISTICS & APPLIED PROBABILITY
author_facet STATISTICS & APPLIED PROBABILITY
Jeynes, C.
Barradas, N.P.
Marriott, P.K.
Boudreault, G.
Jenkin, M.
Wendler, E.
Webb, R.P.
format Review
author Jeynes, C.
Barradas, N.P.
Marriott, P.K.
Boudreault, G.
Jenkin, M.
Wendler, E.
Webb, R.P.
spellingShingle Jeynes, C.
Barradas, N.P.
Marriott, P.K.
Boudreault, G.
Jenkin, M.
Wendler, E.
Webb, R.P.
Elemental thin film depth profiles by ion beam analysis using simulated annealing - A new tool
author_sort Jeynes, C.
title Elemental thin film depth profiles by ion beam analysis using simulated annealing - A new tool
title_short Elemental thin film depth profiles by ion beam analysis using simulated annealing - A new tool
title_full Elemental thin film depth profiles by ion beam analysis using simulated annealing - A new tool
title_fullStr Elemental thin film depth profiles by ion beam analysis using simulated annealing - A new tool
title_full_unstemmed Elemental thin film depth profiles by ion beam analysis using simulated annealing - A new tool
title_sort elemental thin film depth profiles by ion beam analysis using simulated annealing - a new tool
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/105496
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