Elemental thin film depth profiles by ion beam analysis using simulated annealing - A new tool
10.1088/0022-3727/36/7/201
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Main Authors: | Jeynes, C., Barradas, N.P., Marriott, P.K., Boudreault, G., Jenkin, M., Wendler, E., Webb, R.P. |
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Other Authors: | STATISTICS & APPLIED PROBABILITY |
Format: | Review |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/105496 |
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Institution: | National University of Singapore |
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