Polarization behaviors of (Bi 3.15 Nd 0.85) Ti 3 O 12 thin films deposited by radio-frequency magnetron sputtering
10.1063/1.2131192
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Main Authors: | Gao, X.S., Xue, J.M., Wang, J. |
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Other Authors: | MATERIALS SCIENCE |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/107172 |
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Institution: | National University of Singapore |
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