The development of RAS and RHEED as in situ probes to monitor dopant segregation in GS-MBE on Si (0 0 1)

10.1016/S0022-0248(01)00811-9

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Main Authors: Hartell, A.D., Tok, E.S., Zhang, J.
Other Authors: MATERIALS SCIENCE
Format: Conference or Workshop Item
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/107316
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-1073162023-10-26T21:51:24Z The development of RAS and RHEED as in situ probes to monitor dopant segregation in GS-MBE on Si (0 0 1) Hartell, A.D. Tok, E.S. Zhang, J. MATERIALS SCIENCE A1. Doping A1. Segregation A3. Chemical vapour deposition processes A3. Molecular beam epitaxy B2. Semiconducting silicon B2. Semiconducting silicon compounds 10.1016/S0022-0248(01)00811-9 Journal of Crystal Growth 227-228 729-734 JCRGA 2014-10-29T08:42:32Z 2014-10-29T08:42:32Z 2001-07 Conference Paper Hartell, A.D., Tok, E.S., Zhang, J. (2001-07). The development of RAS and RHEED as in situ probes to monitor dopant segregation in GS-MBE on Si (0 0 1). Journal of Crystal Growth 227-228 : 729-734. ScholarBank@NUS Repository. https://doi.org/10.1016/S0022-0248(01)00811-9 00220248 http://scholarbank.nus.edu.sg/handle/10635/107316 000169557600141 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
topic A1. Doping
A1. Segregation
A3. Chemical vapour deposition processes
A3. Molecular beam epitaxy
B2. Semiconducting silicon
B2. Semiconducting silicon compounds
spellingShingle A1. Doping
A1. Segregation
A3. Chemical vapour deposition processes
A3. Molecular beam epitaxy
B2. Semiconducting silicon
B2. Semiconducting silicon compounds
Hartell, A.D.
Tok, E.S.
Zhang, J.
The development of RAS and RHEED as in situ probes to monitor dopant segregation in GS-MBE on Si (0 0 1)
description 10.1016/S0022-0248(01)00811-9
author2 MATERIALS SCIENCE
author_facet MATERIALS SCIENCE
Hartell, A.D.
Tok, E.S.
Zhang, J.
format Conference or Workshop Item
author Hartell, A.D.
Tok, E.S.
Zhang, J.
author_sort Hartell, A.D.
title The development of RAS and RHEED as in situ probes to monitor dopant segregation in GS-MBE on Si (0 0 1)
title_short The development of RAS and RHEED as in situ probes to monitor dopant segregation in GS-MBE on Si (0 0 1)
title_full The development of RAS and RHEED as in situ probes to monitor dopant segregation in GS-MBE on Si (0 0 1)
title_fullStr The development of RAS and RHEED as in situ probes to monitor dopant segregation in GS-MBE on Si (0 0 1)
title_full_unstemmed The development of RAS and RHEED as in situ probes to monitor dopant segregation in GS-MBE on Si (0 0 1)
title_sort development of ras and rheed as in situ probes to monitor dopant segregation in gs-mbe on si (0 0 1)
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/107316
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