Evaluation of residual stress in flip chip using 3-D optical interferometry/FEM hybrid technique
10.1111/j.1475-1305.2007.00355.x
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Main Authors: | Su, F., Liu, L., Wang, T. |
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Other Authors: | TEMASEK LABORATORIES |
Format: | Article |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/111396 |
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Institution: | National University of Singapore |
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