Evaluation of residual stress in flip chip using 3-D optical interferometry/FEM hybrid technique

10.1111/j.1475-1305.2007.00355.x

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Bibliographic Details
Main Authors: Su, F., Liu, L., Wang, T.
Other Authors: TEMASEK LABORATORIES
Format: Article
Published: 2014
Subjects:
Online Access:http://scholarbank.nus.edu.sg/handle/10635/111396
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Institution: National University of Singapore

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