Surface roughening effect in sub-keV SIMS depth profiling
10.1016/S0169-4332(02)00638-4
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Main Authors: | Liu, R., Ng, C.M., Wee, A.T.S. |
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Other Authors: | INSTITUTE OF ENGINEERING SCIENCE |
Format: | Conference or Workshop Item |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/113119 |
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Institution: | National University of Singapore |
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