The effect of intrinsic defects on resistive switching based on p-n heterojunction
10.1109/INEC.2013.6466003
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Main Authors: | Zheng, K., Sun, X.W., Teo, K.L. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/114588 |
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Institution: | National University of Singapore |
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