Investigation on Surface Polarization of Al2O3-capped GaN/AlGaN/GaN Heterostructure by Angle-Resolved X-ray Photoelectron Spectroscopy

10.1186/s11671-017-2271-x

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Main Authors:	Duan, T.L, Pan, J.S, Wang, N, Cheng, K, Yu, H.Y
Other Authors:	DEPT OF PHYSICS
Format:	Article
Published:	2020
Subjects:	Aluminum alloys Atomic layer deposition Band structure Deposition Gallium nitride Photoelectrons Photons Polarization X ray photoelectron spectroscopy Angle resolved x ray photoelectron spectroscopy ARXPS Gallium nitrides (GaN) Interface regions Interfacial layer Negative charge Positive charges Surface polarizations Gallium alloys
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/179549
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-179549
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spelling	sg-nus-scholar.10635-1795492023-08-10T08:33:29Z Investigation on Surface Polarization of Al2O3-capped GaN/AlGaN/GaN Heterostructure by Angle-Resolved X-ray Photoelectron Spectroscopy Duan, T.L Pan, J.S Wang, N Cheng, K Yu, H.Y DEPT OF PHYSICS Aluminum alloys Atomic layer deposition Band structure Deposition Gallium nitride Photoelectrons Photons Polarization X ray photoelectron spectroscopy Angle resolved x ray photoelectron spectroscopy ARXPS Gallium nitrides (GaN) Interface regions Interfacial layer Negative charge Positive charges Surface polarizations Gallium alloys 10.1186/s11671-017-2271-x Nanoscale Research Letters 12 499 2020-10-23T04:56:53Z 2020-10-23T04:56:53Z 2017 Article Duan, T.L, Pan, J.S, Wang, N, Cheng, K, Yu, H.Y (2017). Investigation on Surface Polarization of Al2O3-capped GaN/AlGaN/GaN Heterostructure by Angle-Resolved X-ray Photoelectron Spectroscopy. Nanoscale Research Letters 12 : 499. ScholarBank@NUS Repository. https://doi.org/10.1186/s11671-017-2271-x 19317573 https://scholarbank.nus.edu.sg/handle/10635/179549 Attribution 4.0 International http://creativecommons.org/licenses/by/4.0/ Unpaywall 20201031
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
topic	Aluminum alloys Atomic layer deposition Band structure Deposition Gallium nitride Photoelectrons Photons Polarization X ray photoelectron spectroscopy Angle resolved x ray photoelectron spectroscopy ARXPS Gallium nitrides (GaN) Interface regions Interfacial layer Negative charge Positive charges Surface polarizations Gallium alloys
spellingShingle	Aluminum alloys Atomic layer deposition Band structure Deposition Gallium nitride Photoelectrons Photons Polarization X ray photoelectron spectroscopy Angle resolved x ray photoelectron spectroscopy ARXPS Gallium nitrides (GaN) Interface regions Interfacial layer Negative charge Positive charges Surface polarizations Gallium alloys Duan, T.L Pan, J.S Wang, N Cheng, K Yu, H.Y Investigation on Surface Polarization of Al2O3-capped GaN/AlGaN/GaN Heterostructure by Angle-Resolved X-ray Photoelectron Spectroscopy
description	10.1186/s11671-017-2271-x
author2	DEPT OF PHYSICS
author_facet	DEPT OF PHYSICS Duan, T.L Pan, J.S Wang, N Cheng, K Yu, H.Y
format	Article
author	Duan, T.L Pan, J.S Wang, N Cheng, K Yu, H.Y
author_sort	Duan, T.L
title	Investigation on Surface Polarization of Al2O3-capped GaN/AlGaN/GaN Heterostructure by Angle-Resolved X-ray Photoelectron Spectroscopy
title_short	Investigation on Surface Polarization of Al2O3-capped GaN/AlGaN/GaN Heterostructure by Angle-Resolved X-ray Photoelectron Spectroscopy
title_full	Investigation on Surface Polarization of Al2O3-capped GaN/AlGaN/GaN Heterostructure by Angle-Resolved X-ray Photoelectron Spectroscopy
title_fullStr	Investigation on Surface Polarization of Al2O3-capped GaN/AlGaN/GaN Heterostructure by Angle-Resolved X-ray Photoelectron Spectroscopy
title_full_unstemmed	Investigation on Surface Polarization of Al2O3-capped GaN/AlGaN/GaN Heterostructure by Angle-Resolved X-ray Photoelectron Spectroscopy
title_sort	investigation on surface polarization of al2o3-capped gan/algan/gan heterostructure by angle-resolved x-ray photoelectron spectroscopy
publishDate	2020
url	https://scholarbank.nus.edu.sg/handle/10635/179549
_version_	1779152498053873664

Investigation on Surface Polarization of Al2O3-capped GaN/AlGaN/GaN Heterostructure by Angle-Resolved X-ray Photoelectron Spectroscopy

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