Investigation on Surface Polarization of Al2O3-capped GaN/AlGaN/GaN Heterostructure by Angle-Resolved X-ray Photoelectron Spectroscopy
10.1186/s11671-017-2271-x
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| Main Authors: | , , , , |
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| Other Authors: | |
| Format: | Article |
| Published: |
2020
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| Subjects: | |
| Online Access: | https://scholarbank.nus.edu.sg/handle/10635/179549 |
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| Institution: | National University of Singapore |