Seal Integrity Testing Utilizing Non-Destructive Capacitive Sensing for Product Packaging Assurance
10.1109/SENSORS47125.2020.9278879
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Main Authors: | JIEMING PAN, Li Yida, LUO YUXUAN, ZHANG XIANGYU, Zaifeng Yang, Wong Liang Tai,David, Niu Xuhua, Tham Chen Khong, THEAN VOON YEW, AARON |
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Other Authors: | COLLEGE OF DESIGN AND ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
IEEE sensors
2022
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Online Access: | https://scholarbank.nus.edu.sg/handle/10635/218156 |
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Institution: | National University of Singapore |
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