Stress-Memorized HZO for High-Performance Ferroelectric Field-Effect Memtransistor

10.1021/acsaelm.1c01321

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Main Authors: Tsai Shih-Hao, Fang Zihang, WANG XINGHUA, UMESH CHAND, Chun-Kuei Chen, SONU DEVI, SIVAN MAHESWARI, JIEMING PAN, Evgeny Zamburg, THEAN VOON YEW, AARON
Other Authors: DEAN'S OFFICE (ENGINEERING)
Format: Article
Language:English
Published: 2022
Online Access:https://scholarbank.nus.edu.sg/handle/10635/224436
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Institution: National University of Singapore
Language: English
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spelling sg-nus-scholar.10635-2244362024-04-16T11:14:19Z Stress-Memorized HZO for High-Performance Ferroelectric Field-Effect Memtransistor Tsai Shih-Hao Fang Zihang WANG XINGHUA UMESH CHAND Chun-Kuei Chen SONU DEVI SIVAN MAHESWARI JIEMING PAN Evgeny Zamburg THEAN VOON YEW, AARON DEAN'S OFFICE (ENGINEERING) ELECTRICAL AND COMPUTER ENGINEERING 10.1021/acsaelm.1c01321 2022-04-28T05:39:47Z 2022-04-28T05:39:47Z 2022-04-13 Article Tsai Shih-Hao, Fang Zihang, WANG XINGHUA, UMESH CHAND, Chun-Kuei Chen, SONU DEVI, SIVAN MAHESWARI, JIEMING PAN, Evgeny Zamburg, THEAN VOON YEW, AARON (2022-04-13). Stress-Memorized HZO for High-Performance Ferroelectric Field-Effect Memtransistor. ScholarBank@NUS Repository. https://doi.org/10.1021/acsaelm.1c01321 https://scholarbank.nus.edu.sg/handle/10635/224436 en
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
language English
description 10.1021/acsaelm.1c01321
author2 DEAN'S OFFICE (ENGINEERING)
author_facet DEAN'S OFFICE (ENGINEERING)
Tsai Shih-Hao
Fang Zihang
WANG XINGHUA
UMESH CHAND
Chun-Kuei Chen
SONU DEVI
SIVAN MAHESWARI
JIEMING PAN
Evgeny Zamburg
THEAN VOON YEW, AARON
format Article
author Tsai Shih-Hao
Fang Zihang
WANG XINGHUA
UMESH CHAND
Chun-Kuei Chen
SONU DEVI
SIVAN MAHESWARI
JIEMING PAN
Evgeny Zamburg
THEAN VOON YEW, AARON
spellingShingle Tsai Shih-Hao
Fang Zihang
WANG XINGHUA
UMESH CHAND
Chun-Kuei Chen
SONU DEVI
SIVAN MAHESWARI
JIEMING PAN
Evgeny Zamburg
THEAN VOON YEW, AARON
Stress-Memorized HZO for High-Performance Ferroelectric Field-Effect Memtransistor
author_sort Tsai Shih-Hao
title Stress-Memorized HZO for High-Performance Ferroelectric Field-Effect Memtransistor
title_short Stress-Memorized HZO for High-Performance Ferroelectric Field-Effect Memtransistor
title_full Stress-Memorized HZO for High-Performance Ferroelectric Field-Effect Memtransistor
title_fullStr Stress-Memorized HZO for High-Performance Ferroelectric Field-Effect Memtransistor
title_full_unstemmed Stress-Memorized HZO for High-Performance Ferroelectric Field-Effect Memtransistor
title_sort stress-memorized hzo for high-performance ferroelectric field-effect memtransistor
publishDate 2022
url https://scholarbank.nus.edu.sg/handle/10635/224436
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