Stress-Memorized HZO for High-Performance Ferroelectric Field-Effect Memtransistor

10.1021/acsaelm.1c01321

Saved in:

Bibliographic Details
Main Authors:	Tsai Shih-Hao, Fang Zihang, WANG XINGHUA, UMESH CHAND, Chun-Kuei Chen, SONU DEVI, SIVAN MAHESWARI, JIEMING PAN, Evgeny Zamburg, THEAN VOON YEW, AARON
Other Authors:	ELECTRICAL AND COMPUTER ENGINEERING
Format:	Article
Language:	English
Published:	2022
Online Access:	https://scholarbank.nus.edu.sg/handle/10635/224436
Tags:	Add Tag No Tags, Be the first to tag this record!
Institution:	National University of Singapore
Language:	English

Be the first to leave a comment!

Similar Items