Analysis of E-field distributions within high-power devices using IBIC microscopy

Proceedings of the International Symposium on Power Semiconductor Devices and ICs

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Bibliographic Details
Main Authors:	Zmeck, M., Balk, L.J., Heiderhoff, R., Osipowicz, T., Watt, F., Phang, J.C.H., Khambadkone, A.M., Niedernostheide, F.-J., Schulze, H.-J.
Other Authors:	PHYSICS
Format:	Conference or Workshop Item
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/51115
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-51115
record_format	dspace
spelling	sg-nus-scholar.10635-511152015-01-17T08:05:53Z Analysis of E-field distributions within high-power devices using IBIC microscopy Zmeck, M. Balk, L.J. Heiderhoff, R. Osipowicz, T. Watt, F. Phang, J.C.H. Khambadkone, A.M. Niedernostheide, F.-J. Schulze, H.-J. PHYSICS ELECTRICAL & COMPUTER ENGINEERING Proceedings of the International Symposium on Power Semiconductor Devices and ICs 235-238 PISDE 2014-04-24T08:33:39Z 2014-04-24T08:33:39Z 2005 Conference Paper Zmeck, M.,Balk, L.J.,Heiderhoff, R.,Osipowicz, T.,Watt, F.,Phang, J.C.H.,Khambadkone, A.M.,Niedernostheide, F.-J.,Schulze, H.-J. (2005). Analysis of E-field distributions within high-power devices using IBIC microscopy. Proceedings of the International Symposium on Power Semiconductor Devices and ICs : 235-238. ScholarBank@NUS Repository. 10636854 http://scholarbank.nus.edu.sg/handle/10635/51115 NOT_IN_WOS Scopus
institution	National University of Singapore
building	NUS Library
country	Singapore
collection	ScholarBank@NUS
description	Proceedings of the International Symposium on Power Semiconductor Devices and ICs
author2	PHYSICS
author_facet	PHYSICS Zmeck, M. Balk, L.J. Heiderhoff, R. Osipowicz, T. Watt, F. Phang, J.C.H. Khambadkone, A.M. Niedernostheide, F.-J. Schulze, H.-J.
format	Conference or Workshop Item
author	Zmeck, M. Balk, L.J. Heiderhoff, R. Osipowicz, T. Watt, F. Phang, J.C.H. Khambadkone, A.M. Niedernostheide, F.-J. Schulze, H.-J.
spellingShingle	Zmeck, M. Balk, L.J. Heiderhoff, R. Osipowicz, T. Watt, F. Phang, J.C.H. Khambadkone, A.M. Niedernostheide, F.-J. Schulze, H.-J. Analysis of E-field distributions within high-power devices using IBIC microscopy
author_sort	Zmeck, M.
title	Analysis of E-field distributions within high-power devices using IBIC microscopy
title_short	Analysis of E-field distributions within high-power devices using IBIC microscopy
title_full	Analysis of E-field distributions within high-power devices using IBIC microscopy
title_fullStr	Analysis of E-field distributions within high-power devices using IBIC microscopy
title_full_unstemmed	Analysis of E-field distributions within high-power devices using IBIC microscopy
title_sort	analysis of e-field distributions within high-power devices using ibic microscopy
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/51115
_version_	1681083788544704512

Analysis of E-field distributions within high-power devices using IBIC microscopy

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