Analysis of E-field distributions within high-power devices using IBIC microscopy

Analysis of E-field distributions within high-power devices using IBIC microscopy

Proceedings of the International Symposium on Power Semiconductor Devices and ICs

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Bibliographic Details
Main Authors: Zmeck, M., Balk, L.J., Heiderhoff, R., Osipowicz, T., Watt, F., Phang, J.C.H., Khambadkone, A.M., Niedernostheide, F.-J., Schulze, H.-J.
Other Authors: PHYSICS
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/51115
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Institution: National University of Singapore
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Summary:Proceedings of the International Symposium on Power Semiconductor Devices and ICs

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