Analysis of E-field distributions within high-power devices using IBIC microscopy

• Main Authors: Zmeck, M., Balk, L.J., Heiderhoff, R., Osipowicz, T., Watt, F., Phang, J.C.H., Khambadkone, A.M., Niedernostheide, F.-J., Schulze, H.-J.
• Other Authors: PHYSICS
• Format: Conference or Workshop Item
• Published: 2014
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/51115
• Institution: National University of Singapore

Proceedings of the International Symposium on Power Semiconductor Devices and ICs