RTD response time estimation in the presence of temperature variations and its application to semiconductor manufacturing
10.1109/TIM.2007.910097
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Main Authors: | Tan, W.W., Li, R.F.Y., Loh, A.P., Ho, W.K. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/57322 |
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Institution: | National University of Singapore |
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