The role of Ni buffer layer on high yield low temperature hermetic wafer bonding using In/Sn/Cu metallization

10.1063/1.3074367

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Bibliographic Details
Main Authors: Yu, D.-Q., Lee, C., Yan, L.L., Choi, W.K., Yu, A., Lau, J.H.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/57637
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Institution: National University of Singapore