Determination of deflection and Young's modulus of a micro-beam by means of interferometry
10.1088/0957-0233/12/8/340
Saved in:
Main Authors: | Wang, S.H., Tay, C.J., Quan, C., Shang, H.M. |
---|---|
Other Authors: | MECHANICAL ENGINEERING |
Format: | Article |
Published: |
2014
|
Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/59880 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Similar Items
-
Evaluation of micro-beam deflection using interferometry
by: Wang, S.H., et al.
Published: (2014) -
Nanoscale surface deformation inspection using FFT and phase-shifting combined interferometry
by: Quan, C., et al.
Published: (2014) -
Application of the holographic carrier fringe and FFT technique for deformation measurement
by: Quan, C., et al.
Published: (2014) -
Inspection of a micro-cantilever's opened and concealed profile using integrated vertical scanning interferometry
by: Quan, C., et al.
Published: (2014) -
AIM solution to electromagnetic scattering using parametric geometry
by: Ewe, W.-B., et al.
Published: (2014)