Cathodoluminescence contrast of localized defects part II. Defect investigation
Scanning Microscopy
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Main Authors: | Pey, K.L., Phang, J.C.H., Chan, D.S.H., Breeze, J.F., Myhajlenko, S. |
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Other Authors: | ELECTRICAL ENGINEERING |
Format: | Article |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/61921 |
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Institution: | National University of Singapore |
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