Comparative study of radiation- and stress-induced leakage currents in thin gate oxides

10.1088/0268-1242/15/10/305

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Main Authors:	Ang, C.H., Ling, C.H., Cheng, Z.Y., Kim, S.J., Cho, B.J.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/61949
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-61949
record_format	dspace
spelling	sg-nus-scholar.10635-619492023-10-29T22:06:45Z Comparative study of radiation- and stress-induced leakage currents in thin gate oxides Ang, C.H. Ling, C.H. Cheng, Z.Y. Kim, S.J. Cho, B.J. ELECTRICAL ENGINEERING 10.1088/0268-1242/15/10/305 Semiconductor Science and Technology 15 10 961-964 SSTEE 2014-06-17T06:45:46Z 2014-06-17T06:45:46Z 2000-10 Article Ang, C.H., Ling, C.H., Cheng, Z.Y., Kim, S.J., Cho, B.J. (2000-10). Comparative study of radiation- and stress-induced leakage currents in thin gate oxides. Semiconductor Science and Technology 15 (10) : 961-964. ScholarBank@NUS Repository. https://doi.org/10.1088/0268-1242/15/10/305 02681242 http://scholarbank.nus.edu.sg/handle/10635/61949 000089963700007 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	10.1088/0268-1242/15/10/305
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING Ang, C.H. Ling, C.H. Cheng, Z.Y. Kim, S.J. Cho, B.J.
format	Article
author	Ang, C.H. Ling, C.H. Cheng, Z.Y. Kim, S.J. Cho, B.J.
spellingShingle	Ang, C.H. Ling, C.H. Cheng, Z.Y. Kim, S.J. Cho, B.J. Comparative study of radiation- and stress-induced leakage currents in thin gate oxides
author_sort	Ang, C.H.
title	Comparative study of radiation- and stress-induced leakage currents in thin gate oxides
title_short	Comparative study of radiation- and stress-induced leakage currents in thin gate oxides
title_full	Comparative study of radiation- and stress-induced leakage currents in thin gate oxides
title_fullStr	Comparative study of radiation- and stress-induced leakage currents in thin gate oxides
title_full_unstemmed	Comparative study of radiation- and stress-induced leakage currents in thin gate oxides
title_sort	comparative study of radiation- and stress-induced leakage currents in thin gate oxides
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/61949
_version_	1781782124063358976

Comparative study of radiation- and stress-induced leakage currents in thin gate oxides

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