Comparative study of radiation- and stress-induced leakage currents in thin gate oxides
10.1088/0268-1242/15/10/305
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Main Authors: | Ang, C.H., Ling, C.H., Cheng, Z.Y., Kim, S.J., Cho, B.J. |
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Other Authors: | ELECTRICAL ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/61949 |
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Institution: | National University of Singapore |
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