Comparison between leakage currents in thin gate oxides subjected to X-ray radiation and electrical stress degradation
10.1016/S0038-1101(00)00037-X
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sg-nus-scholar.10635-619502023-10-29T22:06:46Z Comparison between leakage currents in thin gate oxides subjected to X-ray radiation and electrical stress degradation Cho, B.J. Kim, S.J. Ling, C.H. Joo, M.-S. Yeo, I.-S. ELECTRICAL ENGINEERING 10.1016/S0038-1101(00)00037-X Solid-State Electronics 44 7 1289-1292 SSELA 2014-06-17T06:45:47Z 2014-06-17T06:45:47Z 2000-07-01 Article Cho, B.J., Kim, S.J., Ling, C.H., Joo, M.-S., Yeo, I.-S. (2000-07-01). Comparison between leakage currents in thin gate oxides subjected to X-ray radiation and electrical stress degradation. Solid-State Electronics 44 (7) : 1289-1292. ScholarBank@NUS Repository. https://doi.org/10.1016/S0038-1101(00)00037-X 00381101 http://scholarbank.nus.edu.sg/handle/10635/61950 000087297100026 Scopus |
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National University of Singapore |
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NUS Library |
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Asia |
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Singapore Singapore |
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NUS Library |
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| description |
10.1016/S0038-1101(00)00037-X |
| author2 |
ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING Cho, B.J. Kim, S.J. Ling, C.H. Joo, M.-S. Yeo, I.-S. |
| format |
Article |
| author |
Cho, B.J. Kim, S.J. Ling, C.H. Joo, M.-S. Yeo, I.-S. |
| spellingShingle |
Cho, B.J. Kim, S.J. Ling, C.H. Joo, M.-S. Yeo, I.-S. Comparison between leakage currents in thin gate oxides subjected to X-ray radiation and electrical stress degradation |
| author_sort |
Cho, B.J. |
| title |
Comparison between leakage currents in thin gate oxides subjected to X-ray radiation and electrical stress degradation |
| title_short |
Comparison between leakage currents in thin gate oxides subjected to X-ray radiation and electrical stress degradation |
| title_full |
Comparison between leakage currents in thin gate oxides subjected to X-ray radiation and electrical stress degradation |
| title_fullStr |
Comparison between leakage currents in thin gate oxides subjected to X-ray radiation and electrical stress degradation |
| title_full_unstemmed |
Comparison between leakage currents in thin gate oxides subjected to X-ray radiation and electrical stress degradation |
| title_sort |
comparison between leakage currents in thin gate oxides subjected to x-ray radiation and electrical stress degradation |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/61950 |
| _version_ |
1781782124248956928 |