Observation of MOSFET degradation due to electrical stressing through gate-to-source and gate-to-drain capacitance measurement

Observation of MOSFET degradation due to electrical stressing through gate-to-source and gate-to-drain capacitance measurement

Electron device letters

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書目詳細資料
Main Authors:	Yeow, Y.T., Ling, C.H., Ah, L.K.
其他作者:	ELECTRICAL ENGINEERING
格式:	Article
出版:	2014
在線閱讀:	http://scholarbank.nus.edu.sg/handle/10635/62510
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