Impact of decoupled plasma nitridation of ultra-thin gate oxide on the performance of p-channel MOSFETs

10.1088/0268-1242/17/6/101

Saved in:
Bibliographic Details
Main Authors: Lek, C.M., Cho, B.J., Ang, C.H., Tan, S.S., Loh, W.Y., Zhen, J.Z., Lap, C.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Others
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/67966
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore
id sg-nus-scholar.10635-67966
record_format dspace
spelling sg-nus-scholar.10635-679662023-10-26T21:39:28Z Impact of decoupled plasma nitridation of ultra-thin gate oxide on the performance of p-channel MOSFETs Lek, C.M. Cho, B.J. Ang, C.H. Tan, S.S. Loh, W.Y. Zhen, J.Z. Lap, C. ELECTRICAL & COMPUTER ENGINEERING 10.1088/0268-1242/17/6/101 Semiconductor Science and Technology 17 6 L25-L28 SSTEE 2014-06-18T05:33:01Z 2014-06-18T05:33:01Z 2002-06 Others Lek, C.M., Cho, B.J., Ang, C.H., Tan, S.S., Loh, W.Y., Zhen, J.Z., Lap, C. (2002-06). Impact of decoupled plasma nitridation of ultra-thin gate oxide on the performance of p-channel MOSFETs. Semiconductor Science and Technology 17 (6) : L25-L28. ScholarBank@NUS Repository. https://doi.org/10.1088/0268-1242/17/6/101 02681242 http://scholarbank.nus.edu.sg/handle/10635/67966 000176642800001 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1088/0268-1242/17/6/101
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
Lek, C.M.
Cho, B.J.
Ang, C.H.
Tan, S.S.
Loh, W.Y.
Zhen, J.Z.
Lap, C.
format Others
author Lek, C.M.
Cho, B.J.
Ang, C.H.
Tan, S.S.
Loh, W.Y.
Zhen, J.Z.
Lap, C.
spellingShingle Lek, C.M.
Cho, B.J.
Ang, C.H.
Tan, S.S.
Loh, W.Y.
Zhen, J.Z.
Lap, C.
Impact of decoupled plasma nitridation of ultra-thin gate oxide on the performance of p-channel MOSFETs
author_sort Lek, C.M.
title Impact of decoupled plasma nitridation of ultra-thin gate oxide on the performance of p-channel MOSFETs
title_short Impact of decoupled plasma nitridation of ultra-thin gate oxide on the performance of p-channel MOSFETs
title_full Impact of decoupled plasma nitridation of ultra-thin gate oxide on the performance of p-channel MOSFETs
title_fullStr Impact of decoupled plasma nitridation of ultra-thin gate oxide on the performance of p-channel MOSFETs
title_full_unstemmed Impact of decoupled plasma nitridation of ultra-thin gate oxide on the performance of p-channel MOSFETs
title_sort impact of decoupled plasma nitridation of ultra-thin gate oxide on the performance of p-channel mosfets
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/67966
_version_ 1781782952291598336