Annihilation of threading dislocations in regrown GaN on electrochemically etched nanoporous GaN template with optimization of buffer layer growth

10.4028/0-87849-471-5.227

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Bibliographic Details
Main Authors: Soh, C.B., Hartono, H., Chow, S.Y., Chua, S.J.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/69418
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Institution: National University of Singapore

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