Characterization of MOS Devices by Scanning Thermal Microscopy (SThM)
Conference Proceedings from the International Symposium for Testing and Failure Analysis
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2014
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sg-nus-scholar.10635-695882015-01-06T16:39:26Z Characterization of MOS Devices by Scanning Thermal Microscopy (SThM) Lee, T.H. Fiege, G.B.M. Altes, A. Zimmermann, G. Ng, V. Heiderhoff, R. Phang, J.C.H. Balk, L.J. ELECTRICAL & COMPUTER ENGINEERING Conference Proceedings from the International Symposium for Testing and Failure Analysis 191-197 2014-06-19T03:02:22Z 2014-06-19T03:02:22Z 2001 Conference Paper Lee, T.H.,Fiege, G.B.M.,Altes, A.,Zimmermann, G.,Ng, V.,Heiderhoff, R.,Phang, J.C.H.,Balk, L.J. (2001). Characterization of MOS Devices by Scanning Thermal Microscopy (SThM). Conference Proceedings from the International Symposium for Testing and Failure Analysis : 191-197. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/69588 NOT_IN_WOS Scopus |
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National University of Singapore |
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NUS Library |
| country |
Singapore |
| collection |
ScholarBank@NUS |
| description |
Conference Proceedings from the International Symposium for Testing and Failure Analysis |
| author2 |
ELECTRICAL & COMPUTER ENGINEERING |
| author_facet |
ELECTRICAL & COMPUTER ENGINEERING Lee, T.H. Fiege, G.B.M. Altes, A. Zimmermann, G. Ng, V. Heiderhoff, R. Phang, J.C.H. Balk, L.J. |
| format |
Conference or Workshop Item |
| author |
Lee, T.H. Fiege, G.B.M. Altes, A. Zimmermann, G. Ng, V. Heiderhoff, R. Phang, J.C.H. Balk, L.J. |
| spellingShingle |
Lee, T.H. Fiege, G.B.M. Altes, A. Zimmermann, G. Ng, V. Heiderhoff, R. Phang, J.C.H. Balk, L.J. Characterization of MOS Devices by Scanning Thermal Microscopy (SThM) |
| author_sort |
Lee, T.H. |
| title |
Characterization of MOS Devices by Scanning Thermal Microscopy (SThM) |
| title_short |
Characterization of MOS Devices by Scanning Thermal Microscopy (SThM) |
| title_full |
Characterization of MOS Devices by Scanning Thermal Microscopy (SThM) |
| title_fullStr |
Characterization of MOS Devices by Scanning Thermal Microscopy (SThM) |
| title_full_unstemmed |
Characterization of MOS Devices by Scanning Thermal Microscopy (SThM) |
| title_sort |
characterization of mos devices by scanning thermal microscopy (sthm) |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/69588 |
| _version_ |
1681087041263108096 |