Comparison of interface trap generation by Fowler-Nordheim electron injection and hot-hole injection using the DCIV method

Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA

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Bibliographic Details
Main Authors: Ng, K.H., Jie, B.B., He, Y.D., Chim, W.K., Li, M.F., Lo, K.F.
Other Authors: ELECTRICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/72526
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Institution: National University of Singapore
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Summary:Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA