Comparison of interface trap generation by Fowler-Nordheim electron injection and hot-hole injection using the DCIV method
Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA
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2014
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sg-nus-scholar.10635-725262015-01-30T19:36:53Z Comparison of interface trap generation by Fowler-Nordheim electron injection and hot-hole injection using the DCIV method Ng, K.H. Jie, B.B. He, Y.D. Chim, W.K. Li, M.F. Lo, K.F. ELECTRICAL ENGINEERING Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 140-144 00234 2014-06-19T05:09:03Z 2014-06-19T05:09:03Z 1999 Conference Paper Ng, K.H.,Jie, B.B.,He, Y.D.,Chim, W.K.,Li, M.F.,Lo, K.F. (1999). Comparison of interface trap generation by Fowler-Nordheim electron injection and hot-hole injection using the DCIV method. Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA : 140-144. ScholarBank@NUS Repository. http://scholarbank.nus.edu.sg/handle/10635/72526 NOT_IN_WOS Scopus |
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National University of Singapore |
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NUS Library |
| country |
Singapore |
| collection |
ScholarBank@NUS |
| description |
Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA |
| author2 |
ELECTRICAL ENGINEERING |
| author_facet |
ELECTRICAL ENGINEERING Ng, K.H. Jie, B.B. He, Y.D. Chim, W.K. Li, M.F. Lo, K.F. |
| format |
Conference or Workshop Item |
| author |
Ng, K.H. Jie, B.B. He, Y.D. Chim, W.K. Li, M.F. Lo, K.F. |
| spellingShingle |
Ng, K.H. Jie, B.B. He, Y.D. Chim, W.K. Li, M.F. Lo, K.F. Comparison of interface trap generation by Fowler-Nordheim electron injection and hot-hole injection using the DCIV method |
| author_sort |
Ng, K.H. |
| title |
Comparison of interface trap generation by Fowler-Nordheim electron injection and hot-hole injection using the DCIV method |
| title_short |
Comparison of interface trap generation by Fowler-Nordheim electron injection and hot-hole injection using the DCIV method |
| title_full |
Comparison of interface trap generation by Fowler-Nordheim electron injection and hot-hole injection using the DCIV method |
| title_fullStr |
Comparison of interface trap generation by Fowler-Nordheim electron injection and hot-hole injection using the DCIV method |
| title_full_unstemmed |
Comparison of interface trap generation by Fowler-Nordheim electron injection and hot-hole injection using the DCIV method |
| title_sort |
comparison of interface trap generation by fowler-nordheim electron injection and hot-hole injection using the dciv method |
| publishDate |
2014 |
| url |
http://scholarbank.nus.edu.sg/handle/10635/72526 |
| _version_ |
1681087581799841792 |