Comparison of interface trap generation by Fowler-Nordheim electron injection and hot-hole injection using the DCIV method

• Main Authors: Ng, K.H., Jie, B.B., He, Y.D., Chim, W.K., Li, M.F., Lo, K.F.
• Other Authors: ELECTRICAL ENGINEERING
• Format: Conference or Workshop Item
• Published: 2014
• Online Access: http://scholarbank.nus.edu.sg/handle/10635/72526
• Institution: National University of Singapore

Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA