Hot-carrier reliability of non-degenerately doped tungsten polycide gate buried-channel p-MOSFETs
Solid-State Electronics
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Main Authors: | Lou, C.L., Chim, W.K., Chan, D.S.H., Pan, Y. |
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Other Authors: | ELECTRICAL ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/80547 |
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Institution: | National University of Singapore |
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