Radiation and electrical stress-induced hole trap-assisted tunneling currents in ultrathin gate oxides

10.1016/S0038-1101(00)00156-8

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Main Authors:	Ang, C.-H., Ling, C.-H., Cho, B.-J., Kim, S.-J., Cheng, Z.-Y.
Other Authors:	ELECTRICAL ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/81038
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-81038
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spelling	sg-nus-scholar.10635-810382023-10-29T21:05:33Z Radiation and electrical stress-induced hole trap-assisted tunneling currents in ultrathin gate oxides Ang, C.-H. Ling, C.-H. Cho, B.-J. Kim, S.-J. Cheng, Z.-Y. ELECTRICAL ENGINEERING 10.1016/S0038-1101(00)00156-8 Solid-State Electronics 44 11 2001-2007 SSELA 2014-10-07T03:03:59Z 2014-10-07T03:03:59Z 2000-11-01 Article Ang, C.-H., Ling, C.-H., Cho, B.-J., Kim, S.-J., Cheng, Z.-Y. (2000-11-01). Radiation and electrical stress-induced hole trap-assisted tunneling currents in ultrathin gate oxides. Solid-State Electronics 44 (11) : 2001-2007. ScholarBank@NUS Repository. https://doi.org/10.1016/S0038-1101(00)00156-8 00381101 http://scholarbank.nus.edu.sg/handle/10635/81038 000165546700016 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
description	10.1016/S0038-1101(00)00156-8
author2	ELECTRICAL ENGINEERING
author_facet	ELECTRICAL ENGINEERING Ang, C.-H. Ling, C.-H. Cho, B.-J. Kim, S.-J. Cheng, Z.-Y.
format	Article
author	Ang, C.-H. Ling, C.-H. Cho, B.-J. Kim, S.-J. Cheng, Z.-Y.
spellingShingle	Ang, C.-H. Ling, C.-H. Cho, B.-J. Kim, S.-J. Cheng, Z.-Y. Radiation and electrical stress-induced hole trap-assisted tunneling currents in ultrathin gate oxides
author_sort	Ang, C.-H.
title	Radiation and electrical stress-induced hole trap-assisted tunneling currents in ultrathin gate oxides
title_short	Radiation and electrical stress-induced hole trap-assisted tunneling currents in ultrathin gate oxides
title_full	Radiation and electrical stress-induced hole trap-assisted tunneling currents in ultrathin gate oxides
title_fullStr	Radiation and electrical stress-induced hole trap-assisted tunneling currents in ultrathin gate oxides
title_full_unstemmed	Radiation and electrical stress-induced hole trap-assisted tunneling currents in ultrathin gate oxides
title_sort	radiation and electrical stress-induced hole trap-assisted tunneling currents in ultrathin gate oxides
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/81038
_version_	1781783963556118528

Radiation and electrical stress-induced hole trap-assisted tunneling currents in ultrathin gate oxides

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