Modeling study of the impact of surface roughness on silicon and germanium UTB MOSFETs

10.1109/TED.2005.857188

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Bibliographic Details
Main Authors:	Low, T., Li, M.-F., Samudra, G., Yeo, Y.-C., Zhu, C., Chin, A., Kwong, D.-L.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	2014
Subjects:	Germanium Mobility Silicon Surface roughness Ultrathin-body (UTB) MOSFETs
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/82712
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Institution:	National University of Singapore

id	sg-nus-scholar.10635-82712
record_format	dspace
spelling	sg-nus-scholar.10635-827122023-10-26T08:58:03Z Modeling study of the impact of surface roughness on silicon and germanium UTB MOSFETs Low, T. Li, M.-F. Samudra, G. Yeo, Y.-C. Zhu, C. Chin, A. Kwong, D.-L. ELECTRICAL & COMPUTER ENGINEERING Germanium Mobility Silicon Surface roughness Ultrathin-body (UTB) MOSFETs 10.1109/TED.2005.857188 IEEE Transactions on Electron Devices 52 11 2430-2439 IETDA 2014-10-07T04:32:37Z 2014-10-07T04:32:37Z 2005-11 Article Low, T., Li, M.-F., Samudra, G., Yeo, Y.-C., Zhu, C., Chin, A., Kwong, D.-L. (2005-11). Modeling study of the impact of surface roughness on silicon and germanium UTB MOSFETs. IEEE Transactions on Electron Devices 52 (11) : 2430-2439. ScholarBank@NUS Repository. https://doi.org/10.1109/TED.2005.857188 00189383 http://scholarbank.nus.edu.sg/handle/10635/82712 000232898200011 Scopus
institution	National University of Singapore
building	NUS Library
continent	Asia
country	Singapore Singapore
content_provider	NUS Library
collection	ScholarBank@NUS
topic	Germanium Mobility Silicon Surface roughness Ultrathin-body (UTB) MOSFETs
spellingShingle	Germanium Mobility Silicon Surface roughness Ultrathin-body (UTB) MOSFETs Low, T. Li, M.-F. Samudra, G. Yeo, Y.-C. Zhu, C. Chin, A. Kwong, D.-L. Modeling study of the impact of surface roughness on silicon and germanium UTB MOSFETs
description	10.1109/TED.2005.857188
author2	ELECTRICAL & COMPUTER ENGINEERING
author_facet	ELECTRICAL & COMPUTER ENGINEERING Low, T. Li, M.-F. Samudra, G. Yeo, Y.-C. Zhu, C. Chin, A. Kwong, D.-L.
format	Article
author	Low, T. Li, M.-F. Samudra, G. Yeo, Y.-C. Zhu, C. Chin, A. Kwong, D.-L.
author_sort	Low, T.
title	Modeling study of the impact of surface roughness on silicon and germanium UTB MOSFETs
title_short	Modeling study of the impact of surface roughness on silicon and germanium UTB MOSFETs
title_full	Modeling study of the impact of surface roughness on silicon and germanium UTB MOSFETs
title_fullStr	Modeling study of the impact of surface roughness on silicon and germanium UTB MOSFETs
title_full_unstemmed	Modeling study of the impact of surface roughness on silicon and germanium UTB MOSFETs
title_sort	modeling study of the impact of surface roughness on silicon and germanium utb mosfets
publishDate	2014
url	http://scholarbank.nus.edu.sg/handle/10635/82712
_version_	1781784205211992064

Modeling study of the impact of surface roughness on silicon and germanium UTB MOSFETs

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