Modeling study of the impact of surface roughness on silicon and germanium UTB MOSFETs
10.1109/TED.2005.857188
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Main Authors: | Low, T., Li, M.-F., Samudra, G., Yeo, Y.-C., Zhu, C., Chin, A., Kwong, D.-L. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/82712 |
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Institution: | National University of Singapore |
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