Plastic deformation and failure analysis of phase change random access memory

• Main Authors: Hongxin, Y., Luping, S., Koon, L.H., Rong, Z., Jianming, Li., Guan, L.K., Chong, C.T.
• 其他作者: ELECTRICAL & COMPUTER ENGINEERING
• 格式: Article
• 出版: 2014
• 在線閱讀: http://scholarbank.nus.edu.sg/handle/10635/82917

10.1143/JJAP.48.04C064