Plastic deformation and failure analysis of phase change random access memory

10.1143/JJAP.48.04C064

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Bibliographic Details
Main Authors:	Hongxin, Y., Luping, S., Koon, L.H., Rong, Z., Jianming, Li., Guan, L.K., Chong, C.T.
Other Authors:	ELECTRICAL & COMPUTER ENGINEERING
Format:	Article
Published:	2014
Online Access:	http://scholarbank.nus.edu.sg/handle/10635/82917
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Institution:	National University of Singapore

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