Plastic deformation and failure analysis of phase change random access memory

10.1143/JJAP.48.04C064

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Bibliographic Details
Main Authors: Hongxin, Y., Luping, S., Koon, L.H., Rong, Z., Jianming, Li., Guan, L.K., Chong, C.T.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/82917
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Institution: National University of Singapore

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