Plastic deformation and failure analysis of phase change random access memory
10.1143/JJAP.48.04C064
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Main Authors: | Hongxin, Y., Luping, S., Koon, L.H., Rong, Z., Jianming, Li., Guan, L.K., Chong, C.T. |
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Other Authors: | ELECTRICAL & COMPUTER ENGINEERING |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/82917 |
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Institution: | National University of Singapore |
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