Plastic deformation and failure analysis of phase change random access memory

Plastic deformation and failure analysis of phase change random access memory

10.1143/JJAP.48.04C064

Saved in:
Bibliographic Details
Main Authors: Hongxin, Y., Luping, S., Koon, L.H., Rong, Z., Jianming, Li., Guan, L.K., Chong, C.T.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/82917
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/82917

Similar Items