High-mobility germanium-tin (GeSn) P-channel MOSFETs featuring metallic source/drain and sub-370°C process modules

10.1109/IEDM.2011.6131569

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Main Authors: Han, G., Su, S., Zhan, C., Zhou, Q., Yang, Y., Wang, L., Guo, P., Wei, W., Wong, C.P., Shen, Z.X., Cheng, B., Yeo, Y.-C.
Other Authors: ELECTRICAL & COMPUTER ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/83801
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-838012015-01-07T12:22:45Z High-mobility germanium-tin (GeSn) P-channel MOSFETs featuring metallic source/drain and sub-370°C process modules Han, G. Su, S. Zhan, C. Zhou, Q. Yang, Y. Wang, L. Guo, P. Wei, W. Wong, C.P. Shen, Z.X. Cheng, B. Yeo, Y.-C. ELECTRICAL & COMPUTER ENGINEERING 10.1109/IEDM.2011.6131569 Technical Digest - International Electron Devices Meeting, IEDM 16.7.1-16.7.3 TDIMD 2014-10-07T04:45:20Z 2014-10-07T04:45:20Z 2011 Conference Paper Han, G.,Su, S.,Zhan, C.,Zhou, Q.,Yang, Y.,Wang, L.,Guo, P.,Wei, W.,Wong, C.P.,Shen, Z.X.,Cheng, B.,Yeo, Y.-C. (2011). High-mobility germanium-tin (GeSn) P-channel MOSFETs featuring metallic source/drain and sub-370°C process modules. Technical Digest - International Electron Devices Meeting, IEDM : 16.7.1-16.7.3. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/IEDM.2011.6131569" target="_blank">https://doi.org/10.1109/IEDM.2011.6131569</a> 9781457705052 01631918 http://scholarbank.nus.edu.sg/handle/10635/83801 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
description 10.1109/IEDM.2011.6131569
author2 ELECTRICAL & COMPUTER ENGINEERING
author_facet ELECTRICAL & COMPUTER ENGINEERING
Han, G.
Su, S.
Zhan, C.
Zhou, Q.
Yang, Y.
Wang, L.
Guo, P.
Wei, W.
Wong, C.P.
Shen, Z.X.
Cheng, B.
Yeo, Y.-C.
format Conference or Workshop Item
author Han, G.
Su, S.
Zhan, C.
Zhou, Q.
Yang, Y.
Wang, L.
Guo, P.
Wei, W.
Wong, C.P.
Shen, Z.X.
Cheng, B.
Yeo, Y.-C.
spellingShingle Han, G.
Su, S.
Zhan, C.
Zhou, Q.
Yang, Y.
Wang, L.
Guo, P.
Wei, W.
Wong, C.P.
Shen, Z.X.
Cheng, B.
Yeo, Y.-C.
High-mobility germanium-tin (GeSn) P-channel MOSFETs featuring metallic source/drain and sub-370°C process modules
author_sort Han, G.
title High-mobility germanium-tin (GeSn) P-channel MOSFETs featuring metallic source/drain and sub-370°C process modules
title_short High-mobility germanium-tin (GeSn) P-channel MOSFETs featuring metallic source/drain and sub-370°C process modules
title_full High-mobility germanium-tin (GeSn) P-channel MOSFETs featuring metallic source/drain and sub-370°C process modules
title_fullStr High-mobility germanium-tin (GeSn) P-channel MOSFETs featuring metallic source/drain and sub-370°C process modules
title_full_unstemmed High-mobility germanium-tin (GeSn) P-channel MOSFETs featuring metallic source/drain and sub-370°C process modules
title_sort high-mobility germanium-tin (gesn) p-channel mosfets featuring metallic source/drain and sub-370°c process modules
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/83801
_version_ 1681089502776393728