3D vs 2D modeling of the effect of die size on delamination in encapsulated IC packages

10.1109/ECTC.2013.6575666

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Bibliographic Details
Main Authors: Ho, S.L., Tay, A.A.O.
Other Authors: MECHANICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/85848
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-858482015-01-17T18:14:19Z 3D vs 2D modeling of the effect of die size on delamination in encapsulated IC packages Ho, S.L. Tay, A.A.O. MECHANICAL ENGINEERING 10.1109/ECTC.2013.6575666 Proceedings - Electronic Components and Technology Conference 807-812 PECCA 2014-10-07T09:12:55Z 2014-10-07T09:12:55Z 2013 Conference Paper Ho, S.L.,Tay, A.A.O. (2013). 3D vs 2D modeling of the effect of die size on delamination in encapsulated IC packages. Proceedings - Electronic Components and Technology Conference : 807-812. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/ECTC.2013.6575666" target="_blank">https://doi.org/10.1109/ECTC.2013.6575666</a> 9781479902330 05695503 http://scholarbank.nus.edu.sg/handle/10635/85848 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
description 10.1109/ECTC.2013.6575666
author2 MECHANICAL ENGINEERING
author_facet MECHANICAL ENGINEERING
Ho, S.L.
Tay, A.A.O.
format Conference or Workshop Item
author Ho, S.L.
Tay, A.A.O.
spellingShingle Ho, S.L.
Tay, A.A.O.
3D vs 2D modeling of the effect of die size on delamination in encapsulated IC packages
author_sort Ho, S.L.
title 3D vs 2D modeling of the effect of die size on delamination in encapsulated IC packages
title_short 3D vs 2D modeling of the effect of die size on delamination in encapsulated IC packages
title_full 3D vs 2D modeling of the effect of die size on delamination in encapsulated IC packages
title_fullStr 3D vs 2D modeling of the effect of die size on delamination in encapsulated IC packages
title_full_unstemmed 3D vs 2D modeling of the effect of die size on delamination in encapsulated IC packages
title_sort 3d vs 2d modeling of the effect of die size on delamination in encapsulated ic packages
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/85848
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