3D vs 2D modeling of the effect of die size on delamination in encapsulated IC packages
10.1109/ECTC.2013.6575666
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sg-nus-scholar.10635-858482015-01-17T18:14:19Z 3D vs 2D modeling of the effect of die size on delamination in encapsulated IC packages Ho, S.L. Tay, A.A.O. MECHANICAL ENGINEERING 10.1109/ECTC.2013.6575666 Proceedings - Electronic Components and Technology Conference 807-812 PECCA 2014-10-07T09:12:55Z 2014-10-07T09:12:55Z 2013 Conference Paper Ho, S.L.,Tay, A.A.O. (2013). 3D vs 2D modeling of the effect of die size on delamination in encapsulated IC packages. Proceedings - Electronic Components and Technology Conference : 807-812. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/ECTC.2013.6575666" target="_blank">https://doi.org/10.1109/ECTC.2013.6575666</a> 9781479902330 05695503 http://scholarbank.nus.edu.sg/handle/10635/85848 NOT_IN_WOS Scopus |
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10.1109/ECTC.2013.6575666 |
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MECHANICAL ENGINEERING |
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MECHANICAL ENGINEERING Ho, S.L. Tay, A.A.O. |
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Conference or Workshop Item |
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Ho, S.L. Tay, A.A.O. |
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Ho, S.L. Tay, A.A.O. 3D vs 2D modeling of the effect of die size on delamination in encapsulated IC packages |
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Ho, S.L. |
title |
3D vs 2D modeling of the effect of die size on delamination in encapsulated IC packages |
title_short |
3D vs 2D modeling of the effect of die size on delamination in encapsulated IC packages |
title_full |
3D vs 2D modeling of the effect of die size on delamination in encapsulated IC packages |
title_fullStr |
3D vs 2D modeling of the effect of die size on delamination in encapsulated IC packages |
title_full_unstemmed |
3D vs 2D modeling of the effect of die size on delamination in encapsulated IC packages |
title_sort |
3d vs 2d modeling of the effect of die size on delamination in encapsulated ic packages |
publishDate |
2014 |
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http://scholarbank.nus.edu.sg/handle/10635/85848 |
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1681089875806257152 |