3D vs 2D modeling of the effect of die size on delamination in encapsulated IC packages
10.1109/ECTC.2013.6575666
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Main Authors: | Ho, S.L., Tay, A.A.O. |
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Other Authors: | MECHANICAL ENGINEERING |
Format: | Conference or Workshop Item |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/85848 |
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Institution: | National University of Singapore |
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