Modeling and simulation of the influence of SOI structure on damage evolution and ultra-shallow junction formed by Ge preamorphization implants and solid phase epitaxial regrowth

Materials Research Society Symposium Proceedings

Saved in:
Bibliographic Details
Main Authors: Mok, K.R.C., Colombeau, B., Jaraiz, M., Castrillo, P., Rubio, J.E., Pinacho, R., Srinivasan, M.P., Benistant, F., Martin-Bragado, I., Hamilton, J.J.
Other Authors: CHEMICAL & BIOMOLECULAR ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/90621
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: National University of Singapore
id sg-nus-scholar.10635-90621
record_format dspace
spelling sg-nus-scholar.10635-906212015-01-08T06:31:23Z Modeling and simulation of the influence of SOI structure on damage evolution and ultra-shallow junction formed by Ge preamorphization implants and solid phase epitaxial regrowth Mok, K.R.C. Colombeau, B. Jaraiz, M. Castrillo, P. Rubio, J.E. Pinacho, R. Srinivasan, M.P. Benistant, F. Martin-Bragado, I. Hamilton, J.J. CHEMICAL & BIOMOLECULAR ENGINEERING Materials Research Society Symposium Proceedings 912 99-104 MRSPD 2014-10-09T07:07:17Z 2014-10-09T07:07:17Z 2006 Conference Paper Mok, K.R.C.,Colombeau, B.,Jaraiz, M.,Castrillo, P.,Rubio, J.E.,Pinacho, R.,Srinivasan, M.P.,Benistant, F.,Martin-Bragado, I.,Hamilton, J.J. (2006). Modeling and simulation of the influence of SOI structure on damage evolution and ultra-shallow junction formed by Ge preamorphization implants and solid phase epitaxial regrowth. Materials Research Society Symposium Proceedings 912 : 99-104. ScholarBank@NUS Repository. 1558998683 02729172 http://scholarbank.nus.edu.sg/handle/10635/90621 NOT_IN_WOS Scopus
institution National University of Singapore
building NUS Library
country Singapore
collection ScholarBank@NUS
description Materials Research Society Symposium Proceedings
author2 CHEMICAL & BIOMOLECULAR ENGINEERING
author_facet CHEMICAL & BIOMOLECULAR ENGINEERING
Mok, K.R.C.
Colombeau, B.
Jaraiz, M.
Castrillo, P.
Rubio, J.E.
Pinacho, R.
Srinivasan, M.P.
Benistant, F.
Martin-Bragado, I.
Hamilton, J.J.
format Conference or Workshop Item
author Mok, K.R.C.
Colombeau, B.
Jaraiz, M.
Castrillo, P.
Rubio, J.E.
Pinacho, R.
Srinivasan, M.P.
Benistant, F.
Martin-Bragado, I.
Hamilton, J.J.
spellingShingle Mok, K.R.C.
Colombeau, B.
Jaraiz, M.
Castrillo, P.
Rubio, J.E.
Pinacho, R.
Srinivasan, M.P.
Benistant, F.
Martin-Bragado, I.
Hamilton, J.J.
Modeling and simulation of the influence of SOI structure on damage evolution and ultra-shallow junction formed by Ge preamorphization implants and solid phase epitaxial regrowth
author_sort Mok, K.R.C.
title Modeling and simulation of the influence of SOI structure on damage evolution and ultra-shallow junction formed by Ge preamorphization implants and solid phase epitaxial regrowth
title_short Modeling and simulation of the influence of SOI structure on damage evolution and ultra-shallow junction formed by Ge preamorphization implants and solid phase epitaxial regrowth
title_full Modeling and simulation of the influence of SOI structure on damage evolution and ultra-shallow junction formed by Ge preamorphization implants and solid phase epitaxial regrowth
title_fullStr Modeling and simulation of the influence of SOI structure on damage evolution and ultra-shallow junction formed by Ge preamorphization implants and solid phase epitaxial regrowth
title_full_unstemmed Modeling and simulation of the influence of SOI structure on damage evolution and ultra-shallow junction formed by Ge preamorphization implants and solid phase epitaxial regrowth
title_sort modeling and simulation of the influence of soi structure on damage evolution and ultra-shallow junction formed by ge preamorphization implants and solid phase epitaxial regrowth
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/90621
_version_ 1681090624831356928