Gap state distribution in amorphous hydrogenated silicon carbide films deduced from photothermal deflection spectroscopy

Gap state distribution in amorphous hydrogenated silicon carbide films deduced from photothermal deflection spectroscopy

10.1063/1.1448888

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Bibliographic Details
Main Authors: Chew, K., Rusli, Yoon, S.F., Ahn, J., Zhang, Q., Ligatchev, V., Teo, E.J., Osipowicz, T., Watt, F.
Other Authors: PHYSICS
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/93875
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Institution: National University of Singapore
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Summary:10.1063/1.1448888

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