Gap state distribution in amorphous hydrogenated silicon carbide films deduced from photothermal deflection spectroscopy
10.1063/1.1448888
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sg-nus-scholar.10635-938752023-10-27T08:52:47Z Gap state distribution in amorphous hydrogenated silicon carbide films deduced from photothermal deflection spectroscopy Chew, K. Rusli Yoon, S.F. Ahn, J. Zhang, Q. Ligatchev, V. Teo, E.J. Osipowicz, T. Watt, F. PHYSICS CHEMISTRY 10.1063/1.1448888 Journal of Applied Physics 91 7 4319-4325 JAPIA 2014-10-16T08:29:27Z 2014-10-16T08:29:27Z 2002-04-01 Article Chew, K., Rusli, Yoon, S.F., Ahn, J., Zhang, Q., Ligatchev, V., Teo, E.J., Osipowicz, T., Watt, F. (2002-04-01). Gap state distribution in amorphous hydrogenated silicon carbide films deduced from photothermal deflection spectroscopy. Journal of Applied Physics 91 (7) : 4319-4325. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1448888 00218979 http://scholarbank.nus.edu.sg/handle/10635/93875 000174663900056 Scopus |
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PHYSICS Chew, K. Rusli Yoon, S.F. Ahn, J. Zhang, Q. Ligatchev, V. Teo, E.J. Osipowicz, T. Watt, F. |
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Chew, K. Rusli Yoon, S.F. Ahn, J. Zhang, Q. Ligatchev, V. Teo, E.J. Osipowicz, T. Watt, F. |
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Chew, K. Rusli Yoon, S.F. Ahn, J. Zhang, Q. Ligatchev, V. Teo, E.J. Osipowicz, T. Watt, F. Gap state distribution in amorphous hydrogenated silicon carbide films deduced from photothermal deflection spectroscopy |
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Chew, K. |
title |
Gap state distribution in amorphous hydrogenated silicon carbide films deduced from photothermal deflection spectroscopy |
title_short |
Gap state distribution in amorphous hydrogenated silicon carbide films deduced from photothermal deflection spectroscopy |
title_full |
Gap state distribution in amorphous hydrogenated silicon carbide films deduced from photothermal deflection spectroscopy |
title_fullStr |
Gap state distribution in amorphous hydrogenated silicon carbide films deduced from photothermal deflection spectroscopy |
title_full_unstemmed |
Gap state distribution in amorphous hydrogenated silicon carbide films deduced from photothermal deflection spectroscopy |
title_sort |
gap state distribution in amorphous hydrogenated silicon carbide films deduced from photothermal deflection spectroscopy |
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2014 |
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http://scholarbank.nus.edu.sg/handle/10635/93875 |
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