Gap state distribution in amorphous hydrogenated silicon carbide films deduced from photothermal deflection spectroscopy

10.1063/1.1448888

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Main Authors: Chew, K., Rusli, Yoon, S.F., Ahn, J., Zhang, Q., Ligatchev, V., Teo, E.J., Osipowicz, T., Watt, F.
Other Authors: PHYSICS
Format: Article
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/93875
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-938752023-10-27T08:52:47Z Gap state distribution in amorphous hydrogenated silicon carbide films deduced from photothermal deflection spectroscopy Chew, K. Rusli Yoon, S.F. Ahn, J. Zhang, Q. Ligatchev, V. Teo, E.J. Osipowicz, T. Watt, F. PHYSICS CHEMISTRY 10.1063/1.1448888 Journal of Applied Physics 91 7 4319-4325 JAPIA 2014-10-16T08:29:27Z 2014-10-16T08:29:27Z 2002-04-01 Article Chew, K., Rusli, Yoon, S.F., Ahn, J., Zhang, Q., Ligatchev, V., Teo, E.J., Osipowicz, T., Watt, F. (2002-04-01). Gap state distribution in amorphous hydrogenated silicon carbide films deduced from photothermal deflection spectroscopy. Journal of Applied Physics 91 (7) : 4319-4325. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1448888 00218979 http://scholarbank.nus.edu.sg/handle/10635/93875 000174663900056 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1063/1.1448888
author2 PHYSICS
author_facet PHYSICS
Chew, K.
Rusli
Yoon, S.F.
Ahn, J.
Zhang, Q.
Ligatchev, V.
Teo, E.J.
Osipowicz, T.
Watt, F.
format Article
author Chew, K.
Rusli
Yoon, S.F.
Ahn, J.
Zhang, Q.
Ligatchev, V.
Teo, E.J.
Osipowicz, T.
Watt, F.
spellingShingle Chew, K.
Rusli
Yoon, S.F.
Ahn, J.
Zhang, Q.
Ligatchev, V.
Teo, E.J.
Osipowicz, T.
Watt, F.
Gap state distribution in amorphous hydrogenated silicon carbide films deduced from photothermal deflection spectroscopy
author_sort Chew, K.
title Gap state distribution in amorphous hydrogenated silicon carbide films deduced from photothermal deflection spectroscopy
title_short Gap state distribution in amorphous hydrogenated silicon carbide films deduced from photothermal deflection spectroscopy
title_full Gap state distribution in amorphous hydrogenated silicon carbide films deduced from photothermal deflection spectroscopy
title_fullStr Gap state distribution in amorphous hydrogenated silicon carbide films deduced from photothermal deflection spectroscopy
title_full_unstemmed Gap state distribution in amorphous hydrogenated silicon carbide films deduced from photothermal deflection spectroscopy
title_sort gap state distribution in amorphous hydrogenated silicon carbide films deduced from photothermal deflection spectroscopy
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/93875
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