Gap state distribution in amorphous hydrogenated silicon carbide films deduced from photothermal deflection spectroscopy
10.1063/1.1448888
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Main Authors: | Chew, K., Rusli, Yoon, S.F., Ahn, J., Zhang, Q., Ligatchev, V., Teo, E.J., Osipowicz, T., Watt, F. |
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Other Authors: | PHYSICS |
Format: | Article |
Published: |
2014
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Online Access: | http://scholarbank.nus.edu.sg/handle/10635/93875 |
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Institution: | National University of Singapore |
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