A surface and interface study on the InSb/GaAs heterostructures
Thin Solid Films
Saved in:
Main Authors: | Li, K., Wee, A.T.S., Lin, J., Lee, K.K., Watt, F., Tan, K.L., Feng, Z.C., Webb, J.B. |
---|---|
Other Authors: | PHYSICS |
Format: | Article |
Published: |
2014
|
Subjects: | |
Online Access: | http://scholarbank.nus.edu.sg/handle/10635/95693 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | National University of Singapore |
Similar Items
-
Surface and interface studies of titanium silicide formation
by: Wee, A.T.S., et al.
Published: (2014) -
Thickness dependent valence fluctuation of CeN film
by: Xiao, W., et al.
Published: (2014) -
Characterisation of Ge nanocrystals in co-sputtered Ge+SiO2 system using raman spectroscopy, RBS and TEM
by: Ho, Y.W., et al.
Published: (2014) -
Raman and Rutherford backscattering analyses of cubic SiC thin films grown on Si by vertical chemical vapor deposition
by: Feng, Z.C., et al.
Published: (2014) -
Quantitative analysis of a-Si1 - XCx:H thin films
by: Gracin, D., et al.
Published: (2014)