Characterization of striations in silicon wafers by a multipass Fabry-Perot Rayleigh-Brillouin scattering spectrometer
Journal of Materials Research
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Main Authors: | Taijing, Lu, Ng, S.C. |
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其他作者: | PHYSICS |
格式: | Article |
出版: |
2014
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在線閱讀: | http://scholarbank.nus.edu.sg/handle/10635/95967 |
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