Approach to interface roughness of silicide thin films by micro-Raman imaging

10.1116/1.1868646

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Bibliographic Details
Main Authors: Zhao, F.F., Sun, W.X., Feng, Y.P., Zheng, J.Z., Shen, Z.X., Pang, C.H., Chan, L.H.
Other Authors: PHYSICS
Format: Conference or Workshop Item
Published: 2014
Online Access:http://scholarbank.nus.edu.sg/handle/10635/98638
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-986382023-10-29T21:04:56Z Approach to interface roughness of silicide thin films by micro-Raman imaging Zhao, F.F. Sun, W.X. Feng, Y.P. Zheng, J.Z. Shen, Z.X. Pang, C.H. Chan, L.H. PHYSICS 10.1116/1.1868646 Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures 23 2 468-474 JVTBD 2014-10-16T09:49:36Z 2014-10-16T09:49:36Z 2005 Conference Paper Zhao, F.F., Sun, W.X., Feng, Y.P., Zheng, J.Z., Shen, Z.X., Pang, C.H., Chan, L.H. (2005). Approach to interface roughness of silicide thin films by micro-Raman imaging. Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures 23 (2) : 468-474. ScholarBank@NUS Repository. https://doi.org/10.1116/1.1868646 10711023 http://scholarbank.nus.edu.sg/handle/10635/98638 000228788600021 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
description 10.1116/1.1868646
author2 PHYSICS
author_facet PHYSICS
Zhao, F.F.
Sun, W.X.
Feng, Y.P.
Zheng, J.Z.
Shen, Z.X.
Pang, C.H.
Chan, L.H.
format Conference or Workshop Item
author Zhao, F.F.
Sun, W.X.
Feng, Y.P.
Zheng, J.Z.
Shen, Z.X.
Pang, C.H.
Chan, L.H.
spellingShingle Zhao, F.F.
Sun, W.X.
Feng, Y.P.
Zheng, J.Z.
Shen, Z.X.
Pang, C.H.
Chan, L.H.
Approach to interface roughness of silicide thin films by micro-Raman imaging
author_sort Zhao, F.F.
title Approach to interface roughness of silicide thin films by micro-Raman imaging
title_short Approach to interface roughness of silicide thin films by micro-Raman imaging
title_full Approach to interface roughness of silicide thin films by micro-Raman imaging
title_fullStr Approach to interface roughness of silicide thin films by micro-Raman imaging
title_full_unstemmed Approach to interface roughness of silicide thin films by micro-Raman imaging
title_sort approach to interface roughness of silicide thin films by micro-raman imaging
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/98638
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