Ultra shallow depth profiling of B deltas in Si using a CAMECA IMS 6f

10.1117/12.405374

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Main Authors: Ng, C.M., Wee, A.T.S., Huan, C.H.A., See, A.
Other Authors: PHYSICS
Format: Conference or Workshop Item
Published: 2014
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Online Access:http://scholarbank.nus.edu.sg/handle/10635/98946
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Institution: National University of Singapore
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spelling sg-nus-scholar.10635-989462023-10-30T08:17:22Z Ultra shallow depth profiling of B deltas in Si using a CAMECA IMS 6f Ng, C.M. Wee, A.T.S. Huan, C.H.A. See, A. PHYSICS Boron deltas Low energy profiling Oxygen flooding Sample rotation Secondary ion mass spectrometry 10.1117/12.405374 Proceedings of SPIE - The International Society for Optical Engineering 4227 90-97 PSISD 2014-10-16T09:53:21Z 2014-10-16T09:53:21Z 2000 Conference Paper Ng, C.M., Wee, A.T.S., Huan, C.H.A., See, A. (2000). Ultra shallow depth profiling of B deltas in Si using a CAMECA IMS 6f. Proceedings of SPIE - The International Society for Optical Engineering 4227 : 90-97. ScholarBank@NUS Repository. https://doi.org/10.1117/12.405374 0277786X http://scholarbank.nus.edu.sg/handle/10635/98946 000167995300016 Scopus
institution National University of Singapore
building NUS Library
continent Asia
country Singapore
Singapore
content_provider NUS Library
collection ScholarBank@NUS
topic Boron deltas
Low energy profiling
Oxygen flooding
Sample rotation
Secondary ion mass spectrometry
spellingShingle Boron deltas
Low energy profiling
Oxygen flooding
Sample rotation
Secondary ion mass spectrometry
Ng, C.M.
Wee, A.T.S.
Huan, C.H.A.
See, A.
Ultra shallow depth profiling of B deltas in Si using a CAMECA IMS 6f
description 10.1117/12.405374
author2 PHYSICS
author_facet PHYSICS
Ng, C.M.
Wee, A.T.S.
Huan, C.H.A.
See, A.
format Conference or Workshop Item
author Ng, C.M.
Wee, A.T.S.
Huan, C.H.A.
See, A.
author_sort Ng, C.M.
title Ultra shallow depth profiling of B deltas in Si using a CAMECA IMS 6f
title_short Ultra shallow depth profiling of B deltas in Si using a CAMECA IMS 6f
title_full Ultra shallow depth profiling of B deltas in Si using a CAMECA IMS 6f
title_fullStr Ultra shallow depth profiling of B deltas in Si using a CAMECA IMS 6f
title_full_unstemmed Ultra shallow depth profiling of B deltas in Si using a CAMECA IMS 6f
title_sort ultra shallow depth profiling of b deltas in si using a cameca ims 6f
publishDate 2014
url http://scholarbank.nus.edu.sg/handle/10635/98946
_version_ 1781786978405056512